Degradation Processes in Reliability
Degradation Processes in Reliability

Author: Waltraud Kahle

Publisher: John Wiley & Sons

Published: 2016-06-14

Total Pages: 242

ISBN-13: 111930752X

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"Degradation process" refers to many types of reliability models, which correspond to various kinds of stochastic processes used for deterioration modeling. This book focuses on the case of a univariate degradation model with a continuous set of possible outcomes. The envisioned univariate models have one single measurable quantity which is assumed to be observed over time. The first three chapters are each devoted to one degradation model. The last chapter illustrates the use of the previously described degradation models on some real data sets. For each of the degradation models, the authors provide probabilistic results and explore simulation tools for sample paths generation. Various estimation procedures are also developed.

Reliability and Degradation of III-V Optical Devices
Reliability and Degradation of III-V Optical Devices

Author: Osamu Ueda

Publisher: Artech House Publishers

Published: 1996

Total Pages: 376

ISBN-13:

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In developing III-V optical devices for use in optical fiber communication systems, digital-audio systems, and optical printers, reliability is paramount. Understanding the origins and causes of degradation is critical to successful design. This unique book focuses specifically on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing better understand the mechanism of degradation and details the major degradation modes of optical devices fabricated from three different systems. The book explains the character of defects and imperfections induced during material growth and fabrication, presents techniques for failure analysis, and describes methods for elimination of defect-generating mechanisms. More than 200 illustrations and 40 equations help clarify important concepts.

Engineering Asset Management
Engineering Asset Management

Author: Dimitris Kiritsis

Publisher: Springer Science & Business Media

Published: 2011-02-03

Total Pages: 997

ISBN-13: 0857293206

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Engineering Asset Management discusses state-of-the-art trends and developments in the emerging field of engineering asset management as presented at the Fourth World Congress on Engineering Asset Management (WCEAM). It is an excellent reference for practitioners, researchers and students in the multidisciplinary field of asset management, covering such topics as asset condition monitoring and intelligent maintenance; asset data warehousing, data mining and fusion; asset performance and level-of-service models; design and life-cycle integrity of physical assets; deterioration and preservation models for assets; education and training in asset management; engineering standards in asset management; fault diagnosis and prognostics; financial analysis methods for physical assets; human dimensions in integrated asset management; information quality management; information systems and knowledge management; intelligent sensors and devices; maintenance strategies in asset management; optimisation decisions in asset management; risk management in asset management; strategic asset management; and sustainability in asset management.

Advances in Degradation Modeling
Advances in Degradation Modeling

Author: M.S. Nikulin

Publisher: Birkhäuser

Published: 2009-12-15

Total Pages: 416

ISBN-13: 9780817649234

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This volume is a collection of invited chapters covering recent advances in accelerated life testing and degradation models. The book covers a wide range of applications to areas such as reliability, quality control, the health sciences, economics and finance. It is an excellent reference for researchers and practitioners in applied probability and statistics, industrial statistics, the health sciences, quality control, economics, and finance.

Reliability and Failure of Electronic Materials and Devices
Reliability and Failure of Electronic Materials and Devices

Author: Milton Ohring

Publisher: Academic Press

Published: 2014-10-14

Total Pages: 759

ISBN-13: 0080575528

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Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites

Thermodynamic Degradation Science
Thermodynamic Degradation Science

Author: Alec Feinberg

Publisher: John Wiley & Sons

Published: 2016-10-17

Total Pages: 262

ISBN-13: 1119276225

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Thermodynamic degradation science is a new and exciting discipline. This book merges the science of physics of failure with thermodynamics and shows how degradation modeling is improved and enhanced when using thermodynamic principles. The author also goes beyond the traditional physics of failure methods and highlights the importance of having new tools such as “Mesoscopic” noise degradation measurements for prognostics of complex systems, and a conjugate work approach to solving physics of failure problems with accelerated testing applications. Key features: • Demonstrates how the thermodynamics energy approach uncovers key degradation models and their application to accelerated testing. • Demonstrates how thermodynamic degradation models accounts for cumulative stress environments, effect statistical reliability distributions, and are key for reliability test planning. • Provides coverage of the four types of Physics of Failure processes describing aging: Thermal Activation Processes, Forced Aging, Diffusion, and complex combinations of these. • Coverage of numerous key topics including: aging laws; Cumulative Accelerated Stress Test (CAST) Plans; cumulative entropy fatigue damage; reliability statistics and environmental degradation and pollution. Thermodynamic Degradation Science: Physics of Failure, Accelerated Testing, Fatigue and Reliability Applications is essential reading for reliability, cumulative fatigue, and physics of failure engineers as well as students on courses which include thermodynamic engineering and/or physics of failure coverage.

Reliability and Degradation of Semiconductor Lasers and LEDs
Reliability and Degradation of Semiconductor Lasers and LEDs

Author: Mitsuo Fukuda

Publisher: Artech House on Demand

Published: 1991-01-01

Total Pages: 343

ISBN-13: 9780890064658

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This comparative tutorial describes the reasons behind device failures and provides practical information on what can be done to minimize failure-prone designs and enhance device reliability. The text demonstrates how, with such advantages as smaller size, low-cost and simple operation, LEDs are well suited for a wide range of applications - especially in the field of optical fibre communication. This book should prove of interest to engineers and scientists in research, design, manufacturing and development of semiconductor lasers, LEDs and optical transmission systems.

Statistical Modeling for Degradation Data
Statistical Modeling for Degradation Data

Author: Ding-Geng (Din) Chen

Publisher: Springer

Published: 2017-08-31

Total Pages: 382

ISBN-13: 9811051941

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This book focuses on the statistical aspects of the analysis of degradation data. In recent years, degradation data analysis has come to play an increasingly important role in different disciplines such as reliability, public health sciences, and finance. For example, information on products’ reliability can be obtained by analyzing degradation data. In addition, statistical modeling and inference techniques have been developed on the basis of different degradation measures. The book brings together experts engaged in statistical modeling and inference, presenting and discussing important recent advances in degradation data analysis and related applications. The topics covered are timely and have considerable potential to impact both statistics and reliability engineering.