Electron Probe Quantitation
Electron Probe Quantitation

Author: K.F.J. Heinrich

Publisher: Springer Science & Business Media

Published: 1991-06-30

Total Pages: 412

ISBN-13: 0306438240

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In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

Author: S. J. B. Reed

Publisher: Cambridge University Press

Published: 2005-08-25

Total Pages: 232

ISBN-13: 113944638X

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Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Quantitative Electron-probe Microanalysis
Quantitative Electron-probe Microanalysis

Author: Victor D. Scott

Publisher: Prentice Hall

Published: 1995

Total Pages: 0

ISBN-13: 9780131040502

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Examines practical and theoretical aspects of the techniques of electron-probe microanalysis, providing material both for practical microanalysts interested in problems and procedures and for researchers who require greater understanding of the principles and developments in correction models.

Practical Scanning Electron Microscopy
Practical Scanning Electron Microscopy

Author: Joseph Goldstein

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 598

ISBN-13: 1461344220

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In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.

Biomedical Applications of Microprobe Analysis
Biomedical Applications of Microprobe Analysis

Author: Peter Ingram

Publisher: Academic Press

Published: 1999-10-29

Total Pages: 573

ISBN-13: 0080524567

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Biomedical Applications of Microprobe Analysis is a combination reference/laboratory manual for the use of microprobe analysis in both clinical diagnostic and research settings. Also called microchemical microscopy, microprobe analysis uses high-energy bombardment of cells and tissue, in combination with high resolution EM or confocal microscopy to provide a profile of the ion, metal, and mineral concentrations present in a sample. This allows insight into the physiology and pathophysiology of a wide variety of cells and tissues.This book describes methods for obtaining detailed information about the identity and composition of particles too small to be seen with the naked eye and describes how this information can be useful in diagnostic and biomedical research. - Up-to-date review of electron microprobe analysis - Detailed descriptions of sample preparation techniques - Recent technologies including confocal microscopy, infrared microspectroscopy, and laser raman spectroscopy - Over 100 illustrations with numerous specific applications - Contributions by world-renowned experts in the field - Brief summary of highlights precedes each chapter

Microprobe Techniques in the Earth Sciences
Microprobe Techniques in the Earth Sciences

Author: Philip J. Potts

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 430

ISBN-13: 1461520533

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30% discount for members of The Mineralogical Society of Britain and Ireland This text covers the range of microanalytical techniques available for the analysis of geological samples, principally in research applications. Each chapter is written in a clear, informative style and has a tutorial element, designed to introduce each technique for the beginning and experienced researcher alike.

Electron Microprobe Analysis
Electron Microprobe Analysis

Author: S. J. B. Reed

Publisher:

Published: 1993-01-28

Total Pages: 366

ISBN-13:

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1993 paperback of successful physics monograph on electron microprobe analysis, a widely used technique.

Principles of Analytical Electron Microscopy
Principles of Analytical Electron Microscopy

Author: Joseph Goldstein

Publisher: Springer Science & Business Media

Published: 2013-11-11

Total Pages: 458

ISBN-13: 1489920374

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Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.