Proceedings of the Second International Symposium on Process Physics and Modeling in Semiconductor Technology
Author: G. R. Srinivasan
Publisher:
Published: 1991
Total Pages: 826
ISBN-13:
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Author: G. R. Srinivasan
Publisher:
Published: 1991
Total Pages: 826
ISBN-13:
DOWNLOAD EBOOKAuthor: M. Meyyappan
Publisher: The Electrochemical Society
Published: 1997
Total Pages: 366
ISBN-13: 9781566771368
DOWNLOAD EBOOKAuthor: Keith Sheppard
Publisher: The Electrochemical Society
Published: 1995
Total Pages: 430
ISBN-13: 9781566770910
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Publisher:
Published: 1995
Total Pages: 702
ISBN-13:
DOWNLOAD EBOOKAuthor: G. R. Srinivasan
Publisher: The Electrochemical Society
Published: 1996
Total Pages: 546
ISBN-13: 9781566771542
DOWNLOAD EBOOKAuthor: Massachusetts Institute of Technology. Research Laboratory of Electronics
Publisher:
Published: 1992
Total Pages: 464
ISBN-13:
DOWNLOAD EBOOKAuthor: C. M. Osburn
Publisher:
Published: 1989
Total Pages: 804
ISBN-13:
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Publisher:
Published: 1998
Total Pages: 2362
ISBN-13:
DOWNLOAD EBOOKA world list of books in the English language.
Author: Allyson L. Hartzell
Publisher: Springer Science & Business Media
Published: 2010-11-02
Total Pages: 300
ISBN-13: 144196018X
DOWNLOAD EBOOKThe successful launch of viable MEMs product hinges on MEMS reliability, the reliability and qualification for MEMs based products is not widely understood. Companies that have a deep understanding of MEMs reliability view the information as a competitive advantage and are reluctant to share it. MEMs Reliability, focuses on the reliability and manufacturability of MEMS at a fundamental level by addressing process development and characterization, material property characterization, failure mechanisms and physics of failure (POF), design strategies for improving yield, design for reliability (DFR), packaging and testing.
Author: C. S. Murthy
Publisher: The Electrochemical Society
Published: 1999
Total Pages: 244
ISBN-13: 9781566772242
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