RLE Progress Report

RLE Progress Report

Author: Massachusetts Institute of Technology. Research Laboratory of Electronics

Publisher:

Published: 1992

Total Pages: 464

ISBN-13:

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MEMS Reliability

MEMS Reliability

Author: Allyson L. Hartzell

Publisher: Springer Science & Business Media

Published: 2010-11-02

Total Pages: 300

ISBN-13: 144196018X

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The successful launch of viable MEMs product hinges on MEMS reliability, the reliability and qualification for MEMs based products is not widely understood. Companies that have a deep understanding of MEMs reliability view the information as a competitive advantage and are reluctant to share it. MEMs Reliability, focuses on the reliability and manufacturability of MEMS at a fundamental level by addressing process development and characterization, material property characterization, failure mechanisms and physics of failure (POF), design strategies for improving yield, design for reliability (DFR), packaging and testing.