Proceedings of the First International Workshop on Noncontact Atomic Force Microscopy
Author: Seizō Morita
Publisher:
Published: 1999
Total Pages: 212
ISBN-13:
DOWNLOAD EBOOKRead and Download eBook Full
Author: Seizō Morita
Publisher:
Published: 1999
Total Pages: 212
ISBN-13:
DOWNLOAD EBOOKAuthor: International Workshop on Noncontact Atomic Force Microscopy
Publisher:
Published: 1999
Total Pages: 455
ISBN-13:
DOWNLOAD EBOOKAuthor: Roland Bennewitz
Publisher:
Published: 2000
Total Pages: 9
ISBN-13:
DOWNLOAD EBOOKAuthor: Masaru Tsukada
Publisher:
Published: 2002
Total Pages: 330
ISBN-13:
DOWNLOAD EBOOKAuthor: S. Morita
Publisher: Springer Science & Business Media
Published: 2012-12-06
Total Pages: 448
ISBN-13: 3642560199
DOWNLOAD EBOOKSince 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
Author: P M Hoffmann
Publisher:
Published: 2003
Total Pages:
ISBN-13:
DOWNLOAD EBOOKAuthor: S. Morita
Publisher:
Published: 2002
Total Pages:
ISBN-13:
DOWNLOAD EBOOKAuthor: International Conference on Non-Contact Atomic Force Microscopy
Publisher:
Published: 2002
Total Pages: 11
ISBN-13:
DOWNLOAD EBOOK