Advanced Driver Assistance Systems and Autonomous Vehicles

Advanced Driver Assistance Systems and Autonomous Vehicles

Author: Yan Li

Publisher: Springer Nature

Published: 2022-10-28

Total Pages: 628

ISBN-13: 9811950539

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This book provides a comprehensive reference for both academia and industry on the fundamentals, technology details, and applications of Advanced Driver-Assistance Systems (ADAS) and autonomous driving, an emerging and rapidly growing area. The book written by experts covers the most recent research results and industry progress in the following areas: ADAS system design and test methodologies, advanced materials, modern automotive technologies, artificial intelligence, reliability concerns, and failure analysis in ADAS. Numerous images, tables, and didactic schematics are included throughout. This essential book equips readers with an in-depth understanding of all aspects of ADAS, providing insights into key areas for future research and development. • Provides comprehensive coverage of the state-of-the-art in ADAS • Covers advanced materials, deep learning, quality and reliability concerns, and fault isolation and failure analysis • Discusses ADAS system design and test methodologies, novel automotive technologies • Features contributions from both academic and industry authors, for a complete view of this important technology


Proceedings of the First Symposium on Aviation Maintenance and Management-Volume II

Proceedings of the First Symposium on Aviation Maintenance and Management-Volume II

Author: Jinsong Wang

Publisher: Springer Science & Business Media

Published: 2014-03-25

Total Pages: 693

ISBN-13: 3642542336

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Proceedings of the First Symposium on Aviation Maintenance and Management collects selected papers from the conference of ISAMM 2013 in China held in Xi’an on November 25-28, 2013. The book presents state-of-the-art studies on the aviation maintenance, test, fault diagnosis, and prognosis for the aircraft electronic and electrical systems. The selected works can help promote the development of the maintenance and test technology for the aircraft complex systems. Researchers and engineers in the fields of electrical engineering and aerospace engineering can benefit from the book. Jinsong Wang is a professor at School of Mechanical and Electronic Engineering of Northwestern Polytechnical University, China.


Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes

Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes

Author: Bernd O. Kolbesen

Publisher: The Electrochemical Society

Published: 2003

Total Pages: 572

ISBN-13: 9781566773485

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.".. ALTECH 2003 was Symposium J1 held at the 203rd Meeting of the Electrochemical Society in Paris, France from April 27 to May 2, 2003 ... Symposium M1, Diagnostic Techniques for Semiconductor Materials and Devices, was part of the 202nd Meeting of the Electrochemical Society held in Salt Lake City, Utah, from October 21 to 25, 2002 ..."--p. iii.


Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology

Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology

Author: George Q. Huang

Publisher: Springer Science & Business Media

Published: 2009-12-12

Total Pages: 1754

ISBN-13: 3642104304

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This Proceedings volume contains articles presented at the CIRP-Sponsored Inter- tional Conference on Digital Enterprise Technology (DET2009) that takes place December 14–16, 2009 in Hong Kong. This is the 6th DET conference in the series and the first to be held in Asia. Professor Paul Maropoulos initiated, hosted and chaired the 1st International DET Conference held in 2002 at the University of D- ham. Since this inaugural first DET conference, DET conference series has been s- cessfully held in 2004 at Seattle, Washington USA, in 2006 at Setubal Portugal, in 2007 at Bath England, and in 2008 at Nantes France. The DET2009 conference continues to bring together International expertise from the academic and industrial fields, pushing forward the boundaries of research kno- edge and best practice in digital enterprise technology for design and manufacturing, and logistics and supply chain management. Over 120 papers from over 10 countries have been accepted for presentation at DET2009 and inclusion in this Proceedings volume after stringent refereeing process. On behalf of the organizing and program committees, the Editors are grateful to the many people who have made DET2009 possible: to the authors and presenters, es- cially the keynote speakers, to those who have diligently reviewed submissions, to members of International Scientific Committee, Organizing Committee and Advisory Committes, and to colleagues for their hard work in sorting out all the arrangements. We would also like to extend our gratitude to DET2009 sponsors, co-organizers, and supporting organizations.


Characterization and Metrology for ULSI Technology: 2003

Characterization and Metrology for ULSI Technology: 2003

Author: David G. Seiler

Publisher: American Institute of Physics

Published: 2003-10-08

Total Pages: 868

ISBN-13:

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The worldwide semiconductor community faces increasingly difficult challenges as it moves into the manufacturing of chips with feature sizes approaching 100 nm and beyond. The magnitude of these challenges demands special attention from the metrology and analytical measurements community. New paradigms must be found. Adequate research and development for new metrology concepts are urgently needed. Topics include: integrated circuit history, challenges and overviews, front end, lithography, interconnect and back end, and critical analytical techniques. Characterization and metrology are key enablers for developing new semiconductor technology and in improving manufacturing. This book summarizes major issues and gives critical reviews of important measurement techniques that are crucial to continue the advances in semiconductor technology. It covers major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics. The editors believe that this book of collected papers provides a concise and effective portrayal of industry characterization needs and the way they are being addressed by industry, academia, and government to continue the dramatic progress in semiconductor technology. Hopefully, it will also provide a basis for stimulating advances in metrology and new ideas for research and development.


Scientific and Technical Aerospace Reports

Scientific and Technical Aerospace Reports

Author:

Publisher:

Published: 1995

Total Pages: 456

ISBN-13:

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Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.


Optical Characterization of Semiconductors

Optical Characterization of Semiconductors

Author: Sidney Perkowitz

Publisher: Elsevier

Published: 2012-12-02

Total Pages: 229

ISBN-13: 0080984274

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This is the first book to explain, illustrate, and compare the most widely used methods in optics: photoluminescence, infrared spectroscopy, and Raman scattering. Written with non-experts in mind, the book develops the background needed to understand the why and how of each technique, but does not require special knowledge of semiconductors or optics. Each method is illustrated with numerous case studies. Practical information drawn from the authors experience is given to help establish optical facilities, including commercial sources for equipment, and experimental details. For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods to characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics and photonics, this book provides a unique overview, bringing together these valuable techniques in a coherent wayfor the first time.Discusses and compares infrared, Raman, and photoluminescence methodsEnables readers to choose the best method for a given problemIllustrates applications to help non-experts and industrial users, with answers to selected common problemsPresents fundamentals with examples from the semiconductor literature without excessive abstract discussionFeatures equipment lists and discussion of techniques to help establish characterization laboratories