The Growth of Electron Microscopy
The Growth of Electron Microscopy

Author:

Publisher: Academic Press

Published: 1996-08-05

Total Pages: 919

ISBN-13: 0080577628

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As a complement to The Beginnings of Electron Microscopy, Advances in Imaging and Electron Physics is pleased to present Volume 96, The Growth of Electron Microscopy. This comprehensive collection of articles surveys the accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).

Advances in Imaging and Electron Physics
Advances in Imaging and Electron Physics

Author:

Publisher: Academic Press

Published: 2015-06-09

Total Pages: 269

ISBN-13: 0128025905

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Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading authorities - Informs and updates on all the latest developments in the field

Hearings
Hearings

Author: United States. Congress. House. Committee on Interstate and Foreign Commerce

Publisher:

Published: 1969

Total Pages: 1420

ISBN-13:

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The Beginnings of Electron Microscopy - Part 2
The Beginnings of Electron Microscopy - Part 2

Author: Peter W. Hawkes

Publisher: Academic Press

Published: 2022-04-26

Total Pages: 546

ISBN-13: 0323989209

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The Beginnings of Electron Microscopy - Part 2, Volume 221 in the Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on Recollections from the Early Years: Canada-USA, My Recollection of the Early History of Our Work on Electron Optics and the Electron Microscope, Walter Hoppe (1917–1986), Reminiscences of the Development of Electron Optics and Electron Microscope Instrumentation in Japan, Early Electron Microscopy in The Netherlands, L. L. Marton, 1901-1979, The Invention of the Electron Fresnel Interference Biprism, The Development of the Scanning Electron Microscope, and much more. - Provides the authority and expertise of leading contributors from an international board of authors - Presents the latest release in Advances in Imaging and Electron Physics series

Silicon Processing
Silicon Processing

Author: SYMPOSIUM ON SILICON PROCESSING. (1982 : SAN JOSE) AUTOR

Publisher: ASTM International

Published: 1983

Total Pages: 562

ISBN-13:

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Advances in Optical and Electron Microscopy
Advances in Optical and Electron Microscopy

Author: T Mulvey

Publisher: Academic Press

Published: 2017-07-14

Total Pages: 198

ISBN-13: 1483282244

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Advances in Optical and Electron Microscopy, Volume 11 compiles papers on the important developments in optical and electron microscopy. This book discusses the instrumentation and operation for high-resolution electron microscopy; diffraction pattern and camera length; and electron microscopy of surface structure. The history of surface imaging by conventional transmission electron microscopy; ion probe microscopy; and secondary ion mass spectrometry with high lateral resolution are also elaborated. This text likewise covers the acoustic microscopy; quantitative methods; biological applications and near-surface imaging of solids; and interior imaging. This publication is a beneficial to students and individuals researching on optical and electron microscopy.