Picosecond Electronics and Optoelectronics II
Picosecond Electronics and Optoelectronics II

Author: Frederick J. Leonberger

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 303

ISBN-13: 3642729703

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Over the past five years, there has been an enormous increase in the inter est in and understanding of electronic and optoelectronic devices operating in the picosecond (multigigahertz) range. This has been fueled in a sig nificant way by the spectacular advances in picosecond laser technology, electro optic sampling, III-V devices, and wideband fiber optic systems. Partly to address these advances, a new conference jointly sponsored by the IEEE Lasers and Electrooptics Society (IEEE (LEOS)) and the Op tical Society of America (OSA) was founded and its first meeting held in March 1985. The purpose of this meeting was to bring together work ers in the areas of electronics and optoelectronics who share a common interest in the physics and technology of picosecond solid-state electronic and optoelectronic devices, their multigigahertz applications, and ultrafast measurement techniques. Emphasis was placed on the interdisciplinary as pects of these areas, since each area is covered by its own topical meeting. This meeting was quite successful and led to a second meeting, of which this volume forms the proceedings.

Ultrafast Phenomena VII
Ultrafast Phenomena VII

Author: Charles B. Harris

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 567

ISBN-13: 3642842690

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Recent improvements in the performance of light sources, i.e. reduction in pulse length and increases in wavelength range and power levels, have led to ultrafast technology becoming a basic tool in a wide variety of scientific fields. This book describes the remarkable technological improvements and results of new applications in the natural sciences and various engineering fields.

Infrared and Raman Spectroscopic Imaging
Infrared and Raman Spectroscopic Imaging

Author: Reiner Salzer

Publisher: John Wiley & Sons

Published: 2014-11-03

Total Pages: 656

ISBN-13: 3527336524

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This second edition of the successful ready reference is updated and revised with approximately 30% new content to reflect the numerous instrumental developments and improvements, as well as the significant expansion of this rapidly developing field. For example, the combination of IR imaging with AFM has enhanced the achievable lateral resolution by an order of magnitude down to a few hundred nanometers, thus launching a multiplicity of new applications in material science. Furthermore, Raman and IR spectroscopic imaging have become key technologies for the life sciences and today contribute tremendously to a better and more detailed understanding of numerous biological and medical research topics. The topical structure of this new edition is now subdivided into four parts. The first treats the fundamentals of the instrumentation for infrared and Raman imaging and mapping and an overview on the chemometric tools for image analysis. The second part describes a wide varie-ty of applications ranging from biomedical via food, agriculture and plants to polymers and pharmaceuticals. This is followed by a description of imaging techniques operating beyond the diffraction limit, while the final part covers special methodical developments and their utility in specific fields. With its many valuable practical tips, this is a must-have overview for researchers in academic and industrial laboratories wishing to obtain reliable results with this method.