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Author: D Williams
Publisher: CRC Press
Published: 2000-01-01
Total Pages: 546
ISBN-13: 9780750306850
DOWNLOAD EBOOKMicrobeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic engineering will find useful information in this volume.
Author: Microbeam Analysis Society. Conference
Publisher: Wiley-VCH Verlag GmbH
Published: 1995
Total Pages: 506
ISBN-13: 9781560819196
DOWNLOAD EBOOKAuthor: A.G Fitzgerald
Publisher: Routledge
Published: 2017-07-12
Total Pages: 1000
ISBN-13: 1351420526
DOWNLOAD EBOOKQuantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used to analyze subatomic quantities of materials blasted from a surface by a laser or particle beam, providing information on the structure and composition of the material. Contributed to by international experts, the book is unique in the breadth of microbeam analytical techniques covered. For each technique, it develops the theoretical background, discusses practical details relating to choice of equipment, and describes the current advances. The book highlights developments relating to Auger electron spectroscopy in scanning electron microscopes and transmission electron microscopes and advances in surface analytical imaging and accelerated ion beam-surface interactions.
Author: A.G Fitzgerald
Publisher: CRC Press
Published: 1993-01-01
Total Pages: 1000
ISBN-13: 9780750302562
DOWNLOAD EBOOKQuantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used to analyze subatomic quantities of materials blasted from a surface by a laser or particle beam, providing information on the structure and composition of the material. Contributed to by international experts, the book is unique in the breadth of microbeam analytical techniques covered. For each technique, it develops the theoretical background, discusses practical details relating to choice of equipment, and describes the current advances. The book highlights developments relating to Auger electron spectroscopy in scanning electron microscopes and transmission electron microscopes and advances in surface analytical imaging and accelerated ion beam-surface interactions.
Author: K.F.J. Heinrich
Publisher: Springer Science & Business Media
Published: 2013-06-29
Total Pages: 397
ISBN-13: 1489926178
DOWNLOAD EBOOKIn 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.
Author: K.F.J. Heinrich
Publisher: Springer Science & Business Media
Published: 1991-06-30
Total Pages: 412
ISBN-13: 0306438240
DOWNLOAD EBOOKIn 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.
Author: Beddow
Publisher: CRC Press
Published: 2018-01-18
Total Pages: 263
ISBN-13: 1351083805
DOWNLOAD EBOOKVolume I present an important exposition of some of the most significant areas where particle characterization is applied. The technological fields include pharmaceutical materials, bulk solids, and explosions.
Author: National Institute of Standards and Technology (U.S.)
Publisher:
Published: 1991
Total Pages: 480
ISBN-13:
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