Ion Beam Handbook for Material Analysis
Ion Beam Handbook for Material Analysis

Author: James W. Mayer

Publisher: Elsevier

Published: 2012-12-02

Total Pages: 511

ISBN-13: 0323139868

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Ion Beam Handbook for Material Analysis emerged from the U.S.-Italy Seminar on Ion Beam Analysis of Near Surface Regions held at the Baia-Verde Hotel, Catania, June 17-20, 1974. The seminar was sponsored by the National Science Foundation and the Consiglio Nazionale delle Ricerche under the United States-Italy Cooperative Science Program. The book provides a useful collection of tables, graphs, and formulas for those involved in ion beam analysis. These tables, graphs, and formulas are divided into five chapters that cover the following topics: energy loss and energy straggling; backscattering spectrometry; channeling; applications of ion-induced nuclear reactions; and the use of ion-induced X-ray yields.

Handbook of Modern Ion Beam Materials Analysis 2 Volume Set
Handbook of Modern Ion Beam Materials Analysis 2 Volume Set

Author: Y. Wang

Publisher: Materials Research Society

Published: 2010-03-01

Total Pages:

ISBN-13: 9781605112176

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The Handbook of Modern Ion Beam Materials Analysis, 2nd Edition is a compilation of updated techniques and data for use in the ion-beam analysis of materials. The information presented is unavailable collectively from any other source, and places a strong emphasis on practical examples of the analysis techniques as they are applied to common problems. Revised and updated from the popular handbook previously released in 1995, this edition is written and compiled by over 30 leading authorities in the field of ion beam analysis. It provides an excellent introduction to the fundamentals and lab practices of ion beam analysis and is also useful as a teaching text for undergraduate senior or first-year graduate students This text is a comprehensive collection of nuclear and atomic data for the applications of ion beam materials analysis. In addition, the DVD includes bonus info - both the Ion Beam Analysis Nuclear Data Library (IBANDL) and GUPIX Subroutines (CSA and YLS) for X-ray Database.

Handbook of Modern Ion Beam Materials Analysis
Handbook of Modern Ion Beam Materials Analysis

Author: Joseph R. Tesmer

Publisher:

Published: 1995

Total Pages: 728

ISBN-13:

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The Handbook of Modern Ion Beam Materials Analysis is a compilation of updated techniques and data for use in the ion-beam analysis of materials. The information presented is unavailable collectively from any other source, and places a strong emphasis on practical examples of the analysis techniques as they are applied to common problems. The book's 13 chapters cover discussions and examples, while 18 appendices provide extensive compilations of relevant data. Numerous techniques are discussed, including elastic recoil detection and activation analysis. Material in the book pushes the boundaries of ion-beam analysis to higher energies. The detection of light elements is emphasized, and background materials in the areas of energy loss, nuclear theory, instrumentation, analysis pitfalls and radiation safety are also provided for a better understanding of the principles basic to the techniques.

Ion Beams for Materials Analysis
Ion Beams for Materials Analysis

Author: R. Curtis Bird

Publisher: Elsevier

Published: 1989-11-28

Total Pages: 743

ISBN-13: 0080916899

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The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on.

Ion Beams in Materials Processing and Analysis
Ion Beams in Materials Processing and Analysis

Author: Bernd Schmidt

Publisher: Springer Science & Business Media

Published: 2012-12-13

Total Pages: 425

ISBN-13: 3211993568

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A comprehensive review of ion beam application in modern materials research is provided, including the basics of ion beam physics and technology. The physics of ion-solid interactions for ion implantation, ion beam synthesis, sputtering and nano-patterning is treated in detail. Its applications in materials research, development and analysis, developments of special techniques and interaction mechanisms of ion beams with solid state matter result in the optimization of new material properties, which are discussed thoroughly. Solid-state properties optimization for functional materials such as doped semiconductors and metal layers for nano-electronics, metal alloys, and nano-patterned surfaces is demonstrated. The ion beam is an important tool for both materials processing and analysis. Researchers engaged in solid-state physics and materials research, engineers and technologists in the field of modern functional materials will welcome this text.

Handbook of Advanced Materials Testing
Handbook of Advanced Materials Testing

Author: Louise Ferrante

Publisher: CRC Press

Published: 1994-11-29

Total Pages: 1036

ISBN-13: 1482277611

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This work discusses techniques for developing new engineering materials such as elastomers, plastic blends, composites, ceramics and high-temperature alloys. Instrumentation for evaluating their properties and identifying potential end uses are presented.;The book is intended for materials, manufacturing, mechanical, chemical and metallurgical engi

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Author: Sarah Fearn

Publisher: Morgan & Claypool Publishers

Published: 2015-10-16

Total Pages: 67

ISBN-13: 1681740885

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This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.

Non-destructive Ion Beam Analysis of Surfaces
Non-destructive Ion Beam Analysis of Surfaces

Author: Fadeĭ Fadeevich Komarov

Publisher: CRC Press

Published: 1990

Total Pages: 260

ISBN-13: 9782881247262

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A comprehensive tutorial on techniques and interpreting results in experiments concerning radiation technologies such as ion implantation, ion beam mixing, etc. and the effects of radiation on thin surface layers of metals and other materials. Reviews the fundamental features of rapid nuclear analysis methods, such as Rutherford backscattering and channeling, in conjunction with changes of ion energy, ion-induced x-ray emission, and nuclear microanalysis. Also presents the results of the authors' original research into the mechanisms of damage and structural transformations in multicomponent and multilayer structures and in ion-irradiated GaAs and Ni single crystals, and the processes of defect interaction in collision cascades. Originally published in Russian in 1987. Book club price, $84. Annotation copyrighted by Book News, Inc., Portland, OR

Ion Beams for Materials Analysis
Ion Beams for Materials Analysis

Author: J. R. Bird

Publisher: Academic Press

Published: 1989

Total Pages: 748

ISBN-13:

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The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on.

Ion Beam Analysis
Ion Beam Analysis

Author: H. H. Andersen

Publisher: Elsevier

Published: 2017-01-31

Total Pages: 640

ISBN-13: 1483274950

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Nuclear Instruments and Methods, Volume 168: Ion Beam Analysis presents the proceedings of the Fourth International Conference on Ion Beam Analysis, held in Aarhus, Denmark, on June 25–29, 1979. This book provides information pertinent to the methods and applications ion beam analysis. Organized into eight parts encompassing 95 chapters, this volume begins with an overview of the straggling of energy loss for protons and alpha particles. This text then examines the method for the calculation of the stopping of energetic ions in matter. Other chapters consider the method for measuring relative stopping powers for light energetic ions in highly reactive materials. This book discusses as well the stopping power and straggling of lithium ions with velocities around the Bohr velocity. The final chapter deals with the adsorption behavior of different gases on monocrystalline platinum surfaces. This book is a valuable resource for scientists, technologists, students, and research workers.