In Situ Transmission Electron Microscopy Characterization of Nanomaterials

In Situ Transmission Electron Microscopy Characterization of Nanomaterials

Author: Joon Hwan Lee

Publisher:

Published: 2013

Total Pages: 226

ISBN-13:

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With the recent development of in situ transmission electron microscopy (TEM) characterization techniques, the real time study of property-structure correlations in nanomaterials becomes possible. This dissertation reports the direct observations of deformation behavior of Al2O3-ZrO2-MgAl2O4 (AZM) bulk ceramic nanocomposites, strengthening mechanism of twins in YBa2Cu3O7−x (YBCO) thin film, work hardening event in nanocrystalline nickel and deformation of 2wt% Al doped ZnO (AZO) thin film with nanorod structures using the in situ TEM nanoindentation tool. The combined in situ movies with quantitative loading-unloading curves reveal the deformation mechanism of the above nanomaterial systems. At room temperature, in situ dynamic deformation studies show that the AZM nanocomposites undergo the deformation mainly through the grain-boundary sliding and rotation of small grains, i.e., ZrO2 grains, and some of the large grains, i.e., MgAl2O4 grains. We observed both plastic and elastic deformations in different sample regions in these multi-phase ceramic nanocomposites at room temperature. Both ex situ (conventional) and in situ nanoindentation were conducted to reveal the deformation of YBCO films from the directions perpendicular and parallel to the twin interfaces. Hardness measured perpendicular to twin interfaces is ~50% and 40% higher than that measured parallel to twin interfaces, by ex situ and in situ, respectively. By using an in situ nanoindentation tool inside TEM, dynamic work hardening event in nanocrystalline nickel was directly observed. During stain hardening stage, abundant Lomer-Cottrell (L-C) locks formed both within nanograins and against twin boundaries. Two major mechanisms were identified during interactions between L-C locks and twin boundaries. Quantitative nanoindentation experiments recorded during in situ experiments show an increase of yield strength from 1.64 to 2.29 GPa during multiple loading-unloading cycles. In situ TEM nanoindentation has been conducted to explore the size dependent deformation behavior of two different types (type I: ~ 0.51 of width/length ratio and type II: ~ 088 ratio) of AZO nanorods. During the indentation on type I nanord structure, annihilation of defects has been observed which is caused by limitation of the defect activities by relatively small size of the width. On the other hand, type II nanorod shows dislocation activities which enhanced the grain rotation under the external force applied on more isotropic direction through type II nanorod. The electronic version of this dissertation is accessible from http://hdl.handle.net/1969.1/148150


In-Situ Transmission Electron Microscopy

In-Situ Transmission Electron Microscopy

Author: Litao Sun

Publisher: Springer Nature

Published: 2023-03-11

Total Pages: 378

ISBN-13: 9811968454

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This book focuses on in-situ transmission electron microscopy (TEM), an investigatory technique used to observe a sample’s response to a given stimulus (including electron irradiation, thermal excitation, mechanical force, optical excitation, electric and magnetic fields) at the nanoscale in real time. The book introduces readers to the technical strategy behind the in-situ technique and its developments. It reviews the research frontiers of using in-situ TEM in energy conversion and storage, catalysis, nanomaterials synthesis, nanoelectronics, etc. Furthermore, it discusses the future prospects for in-situ TEM. The book offers a valuable guide for all undergraduate and graduate students who are interested in TEM characterization technology. It also serves as a reference source on cutting-edge in-situ techniques for researchers and engineers.


Transmission Electron Microscopy Characterization of Nanomaterials

Transmission Electron Microscopy Characterization of Nanomaterials

Author: Challa S.S.R. Kumar

Publisher: Springer Science & Business Media

Published: 2013-12-09

Total Pages: 718

ISBN-13: 3642389341

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Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.


In-situ Characterization Techniques for Nanomaterials

In-situ Characterization Techniques for Nanomaterials

Author: Challa S.S.R. Kumar

Publisher: Springer

Published: 2018-04-17

Total Pages: 458

ISBN-13: 3662563223

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Seventh volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about In-situ Characterization Techniques for Nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.


Scanning Microscopy for Nanotechnology

Scanning Microscopy for Nanotechnology

Author: Weilie Zhou

Publisher: Springer Science & Business Media

Published: 2007-03-09

Total Pages: 533

ISBN-13: 0387396209

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This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.


Combined Transmission Electron Microscopy and In-situ Scanning Tunneling Microscopy Characterization of Nanomaterials

Combined Transmission Electron Microscopy and In-situ Scanning Tunneling Microscopy Characterization of Nanomaterials

Author: Gemma Martín Malpartida

Publisher:

Published: 2018

Total Pages: 0

ISBN-13:

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The main goal of this thesis has been to apply in-situ Transmission Electron Microscopy (TEM) electrical measurements using a Scanning Tunneling Microscopy (STM) tip, combined with TEM imaging and spectroscopic techniques, in order to address the characterization of relevant nanomaterials. This system has not only been used to measure electrical properties, but also to carry out in-situ experiments with Joule heating and to apply mechanical stresses. A review of the different in-situ TEM techniques, their development over the years and their impact in the scientific community has been presented. Moreover, the instrumental used in this thesis, in particular, the TEM-STM system, has been described. In addition, two techniques for the preparation of specific samples for in-situ TEM-STM experiments have been presented: for nanostructured samples (2D materials, nanowires, etc), and for localized samples (devices, thin layers, bulk samples, etc). A gridcase that allows the use of conventional TEM grids in the TEM-STM system has been designed and fabricated in the context of this thesis. The use of this homemade gridase has allowed us to improve the experiments, offering more reproducibility and versatility. Finally, the calibration of the electrical measurements of the system has been carried out. Using the TEM-STM system, different type of nanostructures have been characterized during the present thesis, from 2D nanostructures, as the elucidation of the effects of electrical current through a single graphene oxide sheet, to functional devices, as the study of the ferroelectric and piezoelectric behavior of structures based on La2WO6, the study of the anisotropic electrical conductivity of GaInP CuPtB type ordering layers used for multijunction solar cells or the study of the conductive filament (CF) formation mechanism in three different Resistive random-access memory (ReRAM) devices. In summary, in-situ microscopy expands the horizons of the characterization and study of materials and, in particular, in the context of this thesis, an in-situ TEM-STM system has been used to electrically characterize samples from nanomaterials to functional devices.


Nanocharacterisation

Nanocharacterisation

Author: Royal Society of Chemistry (Great Britain)

Publisher: Royal Society of Chemistry

Published: 2007

Total Pages: 319

ISBN-13: 0854042415

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Nanocharacterisation is a rapidly developing field. Contributions in this book from across the globe provide an overview of the different microscopic techniques for the characterisation of nanostructures.


The Transmission Electron Microscope

The Transmission Electron Microscope

Author: Khan Maaz

Publisher: BoD – Books on Demand

Published: 2015-09-02

Total Pages: 362

ISBN-13: 9535121502

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This book The Transmission Electron Microscope abundantly illustrates necessary insight and guidance of this powerful and versatile material characterization technique with complete figures and thorough explanations. The second edition of the book presents deep understanding of new techniques from introduction to advance levels, covering in-situ transmission electron microscopy, electron and focused ion beam microscopy, and biological diagnostic through TEM. The chapters cover all major aspects of transmission electron microscopy and their uses in material characterization with special emphasis on both the theoretical and experimental aspects of modern electron microscopy techniques. It is believed that this book will provide a solid foundation of electron microscopy to the students, scientists, and engineers working in the field of material science and condensed matter physics.


Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis

Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis

Author: Nobuo Tanaka

Publisher: World Scientific

Published: 2014-08-21

Total Pages: 616

ISBN-13: 1783264713

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The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.


Advanced Electron Microscopy Characterization of Nanomaterials for Catalysis

Advanced Electron Microscopy Characterization of Nanomaterials for Catalysis

Author:

Publisher:

Published: 2017

Total Pages: 37

ISBN-13:

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Transmission electron microscopy (TEM) has become one of the most powerful techniques in the fields of material science, inorganic chemistry and nanotechnology. In terms of resolutions, advanced TEM may reach a high spatial resolution of 0.05 nm, a high energy-resolution of 7 meV. In addition, in situ TEM can help researcher to image the process happened within 1 ms. This paper reviews the recent technical approaches of applying advanced TEM characterization on nanomaterials for catalysis. The text is organized according to the demanded information of nanocrystals from the perspective of application: for example, size, composition, phase, strain, and morphology. The electron beam induced effect and in situ TEM are also introduced. As a result, I hope this review can help the scientists in related fields to take advantage of advanced TEM to their own researches.