High Performance Memory Testing

High Performance Memory Testing

Author: R. Dean Adams

Publisher: Springer Science & Business Media

Published: 2005-12-29

Total Pages: 252

ISBN-13: 0306479729

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Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.


Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Author: M. Bushnell

Publisher: Springer Science & Business Media

Published: 2006-04-11

Total Pages: 690

ISBN-13: 0306470403

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The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.


Advances in Electronic Testing

Advances in Electronic Testing

Author: Dimitris Gizopoulos

Publisher: Springer Science & Business Media

Published: 2006-01-22

Total Pages: 431

ISBN-13: 0387294090

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This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.


Advanced Test Methods for SRAMs

Advanced Test Methods for SRAMs

Author: Alberto Bosio

Publisher: Springer Science & Business Media

Published: 2009-10-08

Total Pages: 179

ISBN-13: 1441909389

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Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book.


High Performance Python

High Performance Python

Author: Micha Gorelick

Publisher: O'Reilly Media

Published: 2020-04-30

Total Pages: 469

ISBN-13: 1492054992

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Your Python code may run correctly, but you need it to run faster. Updated for Python 3, this expanded edition shows you how to locate performance bottlenecks and significantly speed up your code in high-data-volume programs. By exploring the fundamental theory behind design choices, High Performance Python helps you gain a deeper understanding of Python’s implementation. How do you take advantage of multicore architectures or clusters? Or build a system that scales up and down without losing reliability? Experienced Python programmers will learn concrete solutions to many issues, along with war stories from companies that use high-performance Python for social media analytics, productionized machine learning, and more. Get a better grasp of NumPy, Cython, and profilers Learn how Python abstracts the underlying computer architecture Use profiling to find bottlenecks in CPU time and memory usage Write efficient programs by choosing appropriate data structures Speed up matrix and vector computations Use tools to compile Python down to machine code Manage multiple I/O and computational operations concurrently Convert multiprocessing code to run on local or remote clusters Deploy code faster using tools like Docker


Power-Constrained Testing of VLSI Circuits

Power-Constrained Testing of VLSI Circuits

Author: Nicola Nicolici

Publisher: Springer Science & Business Media

Published: 2006-04-11

Total Pages: 182

ISBN-13: 0306487314

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This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.


High Performance Memories

High Performance Memories

Author: Betty Prince

Publisher: Wiley

Published: 1996-07-25

Total Pages: 306

ISBN-13: 9780471956464

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Traditional Dynamic Random Access Memory Modules, or DRAMs, no longer have adequate bandwidth and access time to keep up with the speed of current microprocessors. In order to solve this problem, many work stations and mainframe manufacturers are starting to use high speed memories, which are memory technologies that improve the speed and efficiency of microprocessors. It is expected that high speed memories will be in widespread use within a few years.


EDA for IC System Design, Verification, and Testing

EDA for IC System Design, Verification, and Testing

Author: Louis Scheffer

Publisher: CRC Press

Published: 2018-10-03

Total Pages: 593

ISBN-13: 1351837591

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Presenting a comprehensive overview of the design automation algorithms, tools, and methodologies used to design integrated circuits, the Electronic Design Automation for Integrated Circuits Handbook is available in two volumes. The first volume, EDA for IC System Design, Verification, and Testing, thoroughly examines system-level design, microarchitectural design, logical verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for IC designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. Save on the complete set.


Electronic Design Automation for IC System Design, Verification, and Testing

Electronic Design Automation for IC System Design, Verification, and Testing

Author: Luciano Lavagno

Publisher: CRC Press

Published: 2017-12-19

Total Pages: 644

ISBN-13: 1482254638

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The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.