Electron Beam Interactions with Solids for Microscopy, Microanalysis & Microlithography
Author: David F. Kyser
Publisher: Scanning Electron Microscopy
Published: 1984
Total Pages: 392
ISBN-13:
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Author: David F. Kyser
Publisher: Scanning Electron Microscopy
Published: 1984
Total Pages: 392
ISBN-13:
DOWNLOAD EBOOKAuthor: Challa S.S.R. Kumar
Publisher: Springer
Published: 2018-04-17
Total Pages: 458
ISBN-13: 3662563223
DOWNLOAD EBOOKSeventh volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about In-situ Characterization Techniques for Nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
Author: Godfried M. Roomans
Publisher:
Published: 1996
Total Pages: 490
ISBN-13: 9780931288494
DOWNLOAD EBOOKAuthor: Ian M. Watt
Publisher: Cambridge University Press
Published: 1997-01-30
Total Pages: 506
ISBN-13: 9780521435918
DOWNLOAD EBOOKThe first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists, earth and biological scientists. This completely revised new edition contains expanded coverage of existing topics and much new material. The author presents the subject of electron microscopy in a readable way, open both to those inexperienced in the technique, and also to practising electron microscopists. The coverage has been brought completely up to date, whilst retaining descriptions of early classic techniques. Currently live topics such as computer control of microscopes, energy-filtered imaging, cryo- and environmental microscopy, digital imaging, and high resolution scanning and transmission microscopy are all described. The highly praised case studies of the first edition have been expanded to include some interesting new examples. This indispensable guide to electron microscopy, written by an author with thirty years practical experience, will be invaluable to new and experienced electron microscopists in any area of science and technology.
Author:
Publisher:
Published: 1991
Total Pages: 594
ISBN-13:
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Publisher:
Published: 1996
Total Pages: 836
ISBN-13:
DOWNLOAD EBOOKAuthor: James A. Knapp
Publisher: Mrs Proceedings
Published: 1990-07-13
Total Pages: 912
ISBN-13:
DOWNLOAD EBOOKThe MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author: 国立国会図書館 (Japan)
Publisher:
Published: 1900
Total Pages: 1762
ISBN-13:
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