FTCS-8
Author:
Publisher:
Published: 1978
Total Pages: 252
ISBN-13:
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Author: Francesco Canestrari
Publisher: Springer
Published: 2015-09-24
Total Pages: 1024
ISBN-13: 9401773424
DOWNLOAD EBOOKThis work presents the results of RILEM TC 237-SIB (Testing and characterization of sustainable innovative bituminous materials and systems). The papers have been selected for publication after a rigorous peer review process and will be an invaluable source to outline and clarify the main directions of present and future research and standardization for bituminous materials and pavements. The following topics are covered: - Characterization of binder-aggregate interaction - Innovative testing of bituminous binders, additives and modifiers - Durability and aging of asphalt pavements - Mixture design and compaction analysis - Environmentally sustainable materials and technologies - Advances in laboratory characterization of bituminous materials - Modeling of road materials and pavement performance prediction - Field measurement and in-situ characterization - Innovative materials for reinforcement and interlayer systems - Cracking and damage characterization of asphalt pavements - Recycling and re-use in road pavements This is the proceedings of the RILEM SIB2015 Symposium (Ancona, Italy, October 7-9, 2015).
Author: Nobuyasu Kanekawa
Publisher: Springer Science & Business Media
Published: 2010-11-08
Total Pages: 226
ISBN-13: 144196715X
DOWNLOAD EBOOKThis book covers the practical application of dependable electronic systems in real industry, such as space, train control and automotive control systems, and network servers/routers. The impact from intermittent errors caused by environmental radiation (neutrons and alpha particles) and EMI (Electro-Magnetic Interference) are introduced together with their most advanced countermeasures. Power Integration is included as one of the most important bases of dependability in electronic systems. Fundamental technical background is provided, along with practical design examples. Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability.
Author: Igor Schagaev
Publisher: Springer Nature
Published:
Total Pages: 414
ISBN-13: 3031551397
DOWNLOAD EBOOKAuthor: Tarek Sobh
Publisher: Springer Science & Business Media
Published: 2007-09-04
Total Pages: 529
ISBN-13: 1402062664
DOWNLOAD EBOOKThis book includes a set of rigorously reviewed world-class manuscripts addressing and detailing state-of-the-art research projects in the areas of Industrial Electronics, Technology, Automation, Telecommunications and Networking. The book includes selected papers from the conference proceedings of the International Conference on Industrial Electronics, Technology, Automation (IETA 2006) and International Conference on Telecommunications and Networking (TeNe 06).
Author: United States. Bureau of Naval Personnel
Publisher:
Published: 1982-07
Total Pages: 36
ISBN-13:
DOWNLOAD EBOOKAuthor: Michael Nicolaidis
Publisher: Springer Science & Business Media
Published: 2013-03-09
Total Pages: 152
ISBN-13: 1475760698
DOWNLOAD EBOOKTest functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
Author: Jan V. Knop
Publisher: IOS Press
Published: 2007
Total Pages: 120
ISBN-13: 1586037560
DOWNLOAD EBOOKSince the cyber attacks are made with the use of global informational infrastructure they could be organized from every part of the planet, which means that we can only resist them with the help of international cooperation. There is a need to harmonize different languages in which specialists speak in order to guarantee the information security.