Enhancement of aviation fuel thermal stability characterization through application of ellipsometry
Author:
Publisher:
Published: 2012
Total Pages: 14
ISBN-13:
DOWNLOAD EBOOKRead and Download eBook Full
Author:
Publisher:
Published: 2012
Total Pages: 14
ISBN-13:
DOWNLOAD EBOOKAuthor:
Publisher:
Published: 1995
Total Pages: 702
ISBN-13:
DOWNLOAD EBOOKAuthor:
Publisher:
Published: 2000
Total Pages: 846
ISBN-13:
DOWNLOAD EBOOKAuthor:
Publisher:
Published: 1992
Total Pages: 348
ISBN-13:
DOWNLOAD EBOOKAuthor:
Publisher:
Published: 1994
Total Pages: 492
ISBN-13:
DOWNLOAD EBOOKAuthor:
Publisher:
Published: 1995
Total Pages: 470
ISBN-13:
DOWNLOAD EBOOKAuthor: Hiroyuki Fujiwara
Publisher: John Wiley & Sons
Published: 2007-09-27
Total Pages: 388
ISBN-13: 9780470060186
DOWNLOAD EBOOKEllipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.
Author:
Publisher:
Published: 1999
Total Pages: 682
ISBN-13:
DOWNLOAD EBOOK