Dimensional Optical Metrology and Inspection for Practical Applications III
Author: SPIE (Society)
Publisher:
Published: 2014
Total Pages:
ISBN-13: 9781628410471
DOWNLOAD EBOOKRead and Download eBook Full
Author: SPIE (Society)
Publisher:
Published: 2014
Total Pages:
ISBN-13: 9781628410471
DOWNLOAD EBOOKAuthor: Kevin G. Harding
Publisher: SPIE-International Society for Optical Engineering
Published: 2019
Total Pages: 0
ISBN-13: 9781510622937
DOWNLOAD EBOOKProvides basic explanations of the operation and application of the most common methods in the field and in commercial use. The first half of the book presents a working knowledge of the mechanism and limitations of optical dimensional measurement methods. The book concludes with a series of manufacturing application examples.
Author: Kevin G. Harding
Publisher:
Published: 2017
Total Pages:
ISBN-13: 9781510609426
DOWNLOAD EBOOKAuthor: Kevin Harding
Publisher: Taylor & Francis
Published: 2016-04-19
Total Pages: 497
ISBN-13: 1439854823
DOWNLOAD EBOOKDue to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods
Author: Toru Yoshizawa
Publisher: CRC Press
Published: 2017-07-28
Total Pages: 866
ISBN-13: 1351831844
DOWNLOAD EBOOKHandbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.
Author: Kevin G. Harding
Publisher: SPIE-International Society for Optical Engineering
Published: 1999
Total Pages: 240
ISBN-13:
DOWNLOAD EBOOKThis work presents a series of papers examining various aspects of three-dimensional imaging, optical metrology and inspection.
Author:
Publisher:
Published: 2018
Total Pages:
ISBN-13: 9781510618459
DOWNLOAD EBOOKAuthor: Wei Gao
Publisher: Walter de Gruyter GmbH & Co KG
Published: 2021-11-22
Total Pages: 655
ISBN-13: 3110542366
DOWNLOAD EBOOKThis book provides readers the fundamentals of optical metrology for precision engineering. The next-generation measurement technologies based on ultrashort pulse laser and optical frequency comb are also presented, making it an essential reference book for various engineering fields. • Introduces fundamental theories and techniques • Combines theories with practical applications • Presents technologies in an easy-to-understand way
Author:
Publisher:
Published: 1999
Total Pages: 246
ISBN-13:
DOWNLOAD EBOOKAuthor: Amelia Carolina Sparavigna
Publisher: MDPI
Published: 2019-06-24
Total Pages: 456
ISBN-13: 3039210920
DOWNLOAD EBOOKImage analysis is a fundamental task for extracting information from images acquired across a range of different devices. Since reliable quantitative results are requested, image analysis requires highly sophisticated numerical and analytical methods—particularly for applications in medicine, security, and remote sensing, where the results of the processing may consist of vitally important data. The contributions to this book provide a good overview of the most important demands and solutions concerning this research area. In particular, the reader will find image analysis applied for feature extraction, encryption and decryption of data, color segmentation, and in the support new technologies. In all the contributions, entropy plays a pivotal role.