Design, Analysis and Test of Logic Circuits Under Uncertainty

Design, Analysis and Test of Logic Circuits Under Uncertainty

Author: Smita Krishnaswamy

Publisher: Springer Science & Business Media

Published: 2012-09-21

Total Pages: 130

ISBN-13: 9048196434

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Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.


Advanced Techniques in Logic Synthesis, Optimizations and Applications

Advanced Techniques in Logic Synthesis, Optimizations and Applications

Author: Kanupriya Gulati

Publisher: Springer Science & Business Media

Published: 2010-11-25

Total Pages: 423

ISBN-13: 1441975187

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This book covers recent advances in the field of logic synthesis and design, including Boolean Matching, Logic Decomposition, Boolean satisfiability, Advanced Synthesis Techniques and Applications of Logic Design. All of these topics are valuable to CAD engineers working in Logic Design, Logic Optimization, and Verification. Engineers seeking opportunities for optimizing VLSI integrated circuits will find this book as an invaluable reference, since there is no existing book that covers this material in a systematic fashion.


Design, Analysis and Test of Logic Circuits Under Uncertainty

Design, Analysis and Test of Logic Circuits Under Uncertainty

Author: Smita Krishnaswamy

Publisher: Springer Science & Business Media

Published: 2012-09-21

Total Pages: 130

ISBN-13: 9048196442

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Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.


Analysis and Design of Resilient VLSI Circuits

Analysis and Design of Resilient VLSI Circuits

Author: Rajesh Garg

Publisher: Springer Science & Business Media

Published: 2009-10-22

Total Pages: 224

ISBN-13: 1441909311

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This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.


Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Author: Sandeep K. Goel

Publisher: CRC Press

Published: 2017-12-19

Total Pages: 259

ISBN-13: 143982942X

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Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause immediate timing failures on both critical and non-critical paths in the circuit. Overviews semiconductor industry test challenges and the need for SDD testing, including basic concepts and introductory material Describes algorithmic solutions incorporated in commercial tools from Mentor Graphics Reviews SDD testing based on "alternative methods" that explores new metrics, top-off ATPG, and circuit topology-based solutions Highlights the advantages and disadvantages of a diverse set of metrics, and identifies scope for improvement Written from the triple viewpoint of university researchers, EDA tool developers, and chip designers and tool users, this book is the first of its kind to address all aspects of SDD testing from such a diverse perspective. The book is designed as a one-stop reference for current industrial practices, research challenges in the domain of SDD testing, and recent developments in SDD solutions.


The Engineering Index Annual

The Engineering Index Annual

Author:

Publisher:

Published: 1988

Total Pages: 2282

ISBN-13:

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Since its creation in 1884, Engineering Index has covered virtually every major engineering innovation from around the world. It serves as the historical record of virtually every major engineering innovation of the 20th century. Recent content is a vital resource for current awareness, new production information, technological forecasting and competitive intelligence. The world?s most comprehensive interdisciplinary engineering database, Engineering Index contains over 10.7 million records. Each year, over 500,000 new abstracts are added from over 5,000 scholarly journals, trade magazines, and conference proceedings. Coverage spans over 175 engineering disciplines from over 80 countries. Updated weekly.


Progress in Industrial Mathematics at ECMI 2000

Progress in Industrial Mathematics at ECMI 2000

Author: Angelo M. Anile

Publisher: Springer Science & Business Media

Published: 2002-03-26

Total Pages: 696

ISBN-13: 9783540425823

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Realizing the need of interaction between universities and research groups in industry, the European Consortium for Mathematics in Industry (ECMI) was founded in 1986 by mathematicians from ten European universities. Since then it has been continuously extending and now it involves about all Euro pean countries. The aims of ECMI are • To promote the use of mathematical models in industry. • To educate industrial mathematicians to meet the growing demand for such experts. • To operate on a European Scale. Mathematics, as the language of the sciences, has always played an im portant role in technology, and now is applied also to a variety of problems in commerce and the environment. European industry is increasingly becoming dependent on high technology and the need for mathematical expertise in both research and development can only grow. These new demands on mathematics have stimulated academic interest in Industrial Mathematics and many mathematical groups world-wide are committed to interaction with industry as part of their research activities. ECMI was founded with the intention of offering its collective knowledge and expertise to European Industry. The experience of ECMI members is that similar technical problems are encountered by different companies in different countries. It is also true that the same mathematical expertise may often be used in differing industrial applications.