Handbook of Damage Mechanics
Handbook of Damage Mechanics

Author: George Z. Voyiadjis

Publisher: Springer

Published: 2014-10-14

Total Pages: 1579

ISBN-13: 9781461455905

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This authoritative reference provides comprehensive coverage of the topics of damage and healing mechanics. Computational modeling of constitutive equations is provided as well as solved examples in engineering applications. A wide range of materials that engineers may encounter are covered, including metals, composites, ceramics, polymers, biomaterials, and nanomaterials. The internationally recognized team of contributors employ a consistent and systematic approach, offering readers a user-friendly reference that is ideal for frequent consultation. Handbook of Damage Mechanics: Nano to Macro Scale for Materials and Structures is ideal for graduate students and faculty, researchers, and professionals in the fields of Mechanical Engineering, Civil Engineering, Aerospace Engineering, Materials Science, and Engineering Mechanics.

Electron Backscatter Diffraction in Materials Science
Electron Backscatter Diffraction in Materials Science

Author: Adam J. Schwartz

Publisher: Springer Science & Business Media

Published: 2010-03-11

Total Pages: 406

ISBN-13: 0387881360

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Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic texture, grain boundary character distributions, lattice strain, phase identification, and much more. The purpose of this book is to provide the fundamental basis for electron backscatter diffraction in materials science, the current state of both hardware and software, and illustrative examples of the applications of electron backscatter diffraction to a wide-range of materials including undeformed and deformed metals and alloys, ceramics, and superconductors. The text has been substantially revised from the first edition, and the authors have kept the format as close as possible to the first edition text. The new developments covered in this book include a more comphrensive coverage of the fundamentals not covered in the first edition or other books in the field, the advances in hardware and software since the first edition was published, and current examples of application of electron backscatter diffraction to solve challenging problems in materials science and condensed-matter physics.

Crystal Plasticity Finite Element Methods
Crystal Plasticity Finite Element Methods

Author: Franz Roters

Publisher: John Wiley & Sons

Published: 2011-08-04

Total Pages: 188

ISBN-13: 3527642099

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Written by the leading experts in computational materials science, this handy reference concisely reviews the most important aspects of plasticity modeling: constitutive laws, phase transformations, texture methods, continuum approaches and damage mechanisms. As a result, it provides the knowledge needed to avoid failures in critical systems udner mechanical load. With its various application examples to micro- and macrostructure mechanics, this is an invaluable resource for mechanical engineers as well as for researchers wanting to improve on this method and extend its outreach.

The Beginnings of Electron Microscopy
The Beginnings of Electron Microscopy

Author: Peter W. Hawkes

Publisher: Academic Press

Published: 2013-11-06

Total Pages: 654

ISBN-13: 1483284654

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The Beginnings of Electron Microscopy presents the technical development of electron microscope. This book examines the mechanical as well as the technical problems arising from the physical properties of the electron. Organized into 19 chapters, this book begins with an overview of the history of scanning electron microscopy and electron beam microanalysis. This text then explains the applications and capabilities of electron microscopes during the war. Other chapters consider the classical techniques of light microscopy. This book presents as well the schematic outline of the preparation techniques for investigation of nerve cells by electron microscopy. The final chapter deals with the historical account of the beginnings of electron microscopy in Russia. This book is a valuable resource for scientists, technologists, physicists, electrical engineers, designers, and technicians. Graduate students as well as researcher workers who are interested in the history of electron microscopy will also find this book extremely useful.