Author: J.H. Richardson

Publisher: Elsevier

Published: 2012-12-02

Total Pages: 512

ISBN-13: 0323147569

Systematic Materials Analysis, Volume IV presents refined instrumental methods available for materials analysis, which involves the complete characterization of a material, including structural and textural analyses in addition to chemical analysis. This volume is composed of 11 chapters. Each chapter on specific instruments outlines the theories of operation and describes their capability for qualitative and quantitative measurements of chemical composition, structure, and texture. The sensitivity and selectivity of each method are emphasized. The specific techniques and instruments covered in this book include the atomic-absorption and atomic-fluorescence flame photometry, ion microprobe, mass spectrometry, neutron diffractometry, polarimetry, polarography, dynamic thermal analysis, and transmission electron microscopy. This book is intended primarily to materials analysts, engineers, researchers, and undergraduate and graduate level students.