An Introduction to Logic Circuit Testing
An Introduction to Logic Circuit Testing

Author: Parag K. Lala

Publisher: Morgan & Claypool Publishers

Published: 2009

Total Pages: 111

ISBN-13: 1598293508

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An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

An Introduction to Logic Circuit Testing
An Introduction to Logic Circuit Testing

Author: Parag K. Lala

Publisher: Springer Nature

Published: 2022-06-01

Total Pages: 99

ISBN-13: 303179785X

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An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

Introduction to Logic Circuits & Logic Design with Verilog
Introduction to Logic Circuits & Logic Design with Verilog

Author: Brock J. LaMeres

Publisher: Springer

Published: 2017-04-17

Total Pages: 468

ISBN-13: 3319538837

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This textbook for courses in Digital Systems Design introduces students to the fundamental hardware used in modern computers. Coverage includes both the classical approach to digital system design (i.e., pen and paper) in addition to the modern hardware description language (HDL) design approach (computer-based). Using this textbook enables readers to design digital systems using the modern HDL approach, but they have a broad foundation of knowledge of the underlying hardware and theory of their designs. This book is designed to match the way the material is actually taught in the classroom. Topics are presented in a manner which builds foundational knowledge before moving onto advanced topics. The author has designed the presentation with learning Goals and assessment at its core. Each section addresses a specific learning outcome that the student should be able to “do” after its completion. The concept checks and exercise problems provide a rich set of assessment tools to measure student performance on each outcome.

Introduction to Logic Circuits & Logic Design with Verilog
Introduction to Logic Circuits & Logic Design with Verilog

Author: Brock J. LaMeres

Publisher: Springer

Published: 2019-04-10

Total Pages: 492

ISBN-13: 3030136051

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This textbook for courses in Digital Systems Design introduces students to the fundamental hardware used in modern computers. Coverage includes both the classical approach to digital system design (i.e., pen and paper) in addition to the modern hardware description language (HDL) design approach (computer-based). Using this textbook enables readers to design digital systems using the modern HDL approach, but they have a broad foundation of knowledge of the underlying hardware and theory of their designs. This book is designed to match the way the material is actually taught in the classroom. Topics are presented in a manner which builds foundational knowledge before moving onto advanced topics. The author has designed the presentation with learning goals and assessment at its core. Each section addresses a specific learning outcome that the student should be able to “do” after its completion. The concept checks and exercise problems provide a rich set of assessment tools to measure student performance on each outcome.

Logic Testing and Design for Testability
Logic Testing and Design for Testability

Author: Hideo Fujiwara

Publisher: MIT Press

Published: 1985

Total Pages: 314

ISBN-13:

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Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing.

Integrated Circuit Test Engineering
Integrated Circuit Test Engineering

Author: Ian A. Grout

Publisher: Springer Science & Business Media

Published: 2005-08-22

Total Pages: 396

ISBN-13: 9781846280238

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Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively

Introduction to IDDQ Testing
Introduction to IDDQ Testing

Author: S. Chakravarty

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 336

ISBN-13: 146156137X

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Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.

Digital Logic Design
Digital Logic Design

Author: Brian Holdsworth

Publisher: Elsevier

Published: 2002-11-01

Total Pages: 535

ISBN-13: 0080477305

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New, updated and expanded topics in the fourth edition include: EBCDIC, Grey code, practical applications of flip-flops, linear and shaft encoders, memory elements and FPGAs. The section on fault-finding has been expanded. A new chapter is dedicated to the interface between digital components and analog voltages. - A highly accessible, comprehensive and fully up to date digital systems text - A well known and respected text now revamped for current courses - Part of the Newnes suite of texts for HND/1st year modules

Principles of Testing Electronic Systems
Principles of Testing Electronic Systems

Author: Samiha Mourad

Publisher: John Wiley & Sons

Published: 2000-07-25

Total Pages: 444

ISBN-13: 9780471319313

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A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references

Digital Integrated Circuits
Digital Integrated Circuits

Author: Evgeni Perelroyzen

Publisher: CRC Press

Published: 2018-10-03

Total Pages: 320

ISBN-13: 142000459X

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A current trend in digital design-the integration of the MATLAB® components Simulink® and Stateflow® for model building, simulations, system testing, and fault detection-allows for better control over the design flow process and, ultimately, for better system results. Digital Integrated Circuits: Design-for-Test Using Simulink® and Stateflow® illustrates the construction of Simulink models for digital project test benches in certain design-for-test fields. The first two chapters of the book describe the major tools used for design-for-test. The author explains the process of Simulink model building, presents the main library blocks of Simulink, and examines the development of finite-state machine modeling using Stateflow diagrams. Subsequent chapters provide examples of Simulink modeling and simulation for the latest design-for-test fields, including combinational and sequential circuits, controllability, and observability; deterministic algorithms; digital circuit dynamics; timing verification; built-in self-test (BIST) architecture; scan cell operations; and functional and diagnostic testing. The book also discusses the automatic test pattern generation (ATPG) process, the logical determinant theory, and joint test action group (JTAG) interface models. Digital Integrated Circuits explores the possibilities of MATLAB's tools in the development of application-specific integrated circuit (ASIC) design systems. The book shows how to incorporate Simulink and Stateflow into the process of modern digital design.