Handbook of Humidity Measurement, Volume 1
Handbook of Humidity Measurement, Volume 1

Author: Ghenadii Korotcenkov

Publisher: CRC Press

Published: 2018-03-15

Total Pages: 598

ISBN-13: 1351400649

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The first volume of The Handbook of Humidity Measurement focuses on the review of devices based on optical principles of measurement such as optical UV, fluorescence hygrometers, optical and fiber-optic sensors of various types. Numerous methods for monitoring the atmosphere have been developed in recent years, based on measuring the absorption of electromagnetic field in different spectral ranges. These methods, covering the optical (FTIR and Lidar techniques), as well as a microwave and THz ranges are discussed in detail in this volume. The role of humidity-sensitive materials in optical and fiber-optic sensors is also detailed. This volume describes the reasons for controlling the humidity, features of water and water vapors, and units used for humidity measurement.

Dependable Embedded Systems
Dependable Embedded Systems

Author: Jörg Henkel

Publisher: Springer Nature

Published: 2020-12-09

Total Pages: 606

ISBN-13: 303052017X

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This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.

Microelectronics Education
Microelectronics Education

Author: Ton J. Mouthaan

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 299

ISBN-13: 9401151105

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Dear participant in the second European Workshop on Microelectronics Education, It is a pleasure to present you the Proceedings of the Second European Workshop on Microelectronics Education and to welcome you at the Workshop. The Organising Committee is very pleased that it has found several key persons, with highly appreciated levels of knowledge and expertise, willing to present Invited Contributions to this Workshop. We have striven for an interesting spread over important areas like the expected demands for educated engineers in the wide field of Microelectronics, and Microsystems, in European industry (and beyond!) and innovations in method and focus of our educational programmes. This is the second European Workshop in this area; the first one was held in Grenoble in France in the spring of 1996. It was the initiative of Georges Kamarinos, Nadine Guillemot and Bernard Courtois to organise this Workshop because they felt that Microelectronics was 'at a turning point' to become the core of the largest industry in the world and that this warranted a serious (re-)consideration of our educational imperatives. It is now two years since and their feeling has become reality: nobody doubts that by the year 2000 the microelecnonics industry will be the largest industrial sector. It is also obvious that because of that and because of the predicted shortfall of educated engineers we must continuously reconsider the quality of our educational approach.

Photoacoustic and Photothermal Phenomena
Photoacoustic and Photothermal Phenomena

Author: Peter Hess

Publisher: Springer

Published: 2014-03-12

Total Pages: 575

ISBN-13: 9783662137048

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photoacoustic and Photothermal Phenomena contains reviews and a large numberof selected contributed papers reporting progress in the application of new photoacoustic and photo- thermal techniques in physics, chemistry, biology, medicine and materials science. Theoretical and experimental work is presented on spectroscopy, kinetics and relaxation, trace analysis, mass and heat transport, surfaces and thin films, nondestructive evaluation,ultrasonics and semiconductors.