Advanced Optical Imaging Technologies V
Author: Xiao-Cong Yuan
Publisher:
Published: 2023
Total Pages: 0
ISBN-13: 9781510656994
DOWNLOAD EBOOKRead and Download eBook Full
Author: Xiao-Cong Yuan
Publisher:
Published: 2023
Total Pages: 0
ISBN-13: 9781510656994
DOWNLOAD EBOOKAuthor: Xiao-Cong Yuan
Publisher:
Published: 2021
Total Pages: 0
ISBN-13: 9781510646421
DOWNLOAD EBOOKAuthor: Min Gu
Publisher: Springer
Published: 2013-06-05
Total Pages: 223
ISBN-13: 354048471X
DOWNLOAD EBOOKOptical microscopy and associated technologies have advanced rapidly along with laser technology. These techniques have stimulated further development of the optical imaging theory, including 3-dimensional microscopy imaging theory, the theory of imaging with ultrashort pulsed beam illumination and the aberration theory for high numerical-aperture objectives. This book introduces these new theories in modern optical microscopy, providing comparisons with classical imaging as appropriate.
Author: Society of Photo-Optical Instrumentation Engineers (SPIE)
Publisher:
Published: 2020
Total Pages: 0
ISBN-13: 9781510639140
DOWNLOAD EBOOKAuthor: Xiao-Cong Yuan
Publisher:
Published: 2019
Total Pages:
ISBN-13: 9781510630895
DOWNLOAD EBOOKAuthor:
Publisher:
Published: 2018
Total Pages:
ISBN-13: 9781510622302
DOWNLOAD EBOOKAuthor: Xiao-Cong Yuan
Publisher:
Published: 2018
Total Pages:
ISBN-13: 9781510622319
DOWNLOAD EBOOKAuthor: Nicusor Iftimia
Publisher: John Wiley & Sons
Published: 2011-04-27
Total Pages: 641
ISBN-13: 1118102711
DOWNLOAD EBOOKThis book provides students, teachers, researchers and clinicians with a strong and established source of information on advanced optical technologies that show real promise of being translated to clinical use.
Author: Wolfgang Osten
Publisher: John Wiley & Sons
Published: 2012-09-10
Total Pages: 471
ISBN-13: 3527648461
DOWNLOAD EBOOKA comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.
Author: Wolfgang Osten
Publisher: Springer Science & Business Media
Published: 2013-08-15
Total Pages: 975
ISBN-13: 3642363598
DOWNLOAD EBOOKIn continuation of the FRINGE Workshop Series this Proceeding contains all contributions presented at the 7. International Workshop on Advanced Optical Imaging and Metrology. The FRINGE Workshop Series is dedicated to the presentation, discussion and dissemination of recent results in Optical Imaging and Metrology. Topics of particular interest for the 7. Workshop are: - New methods and tools for the generation, acquisition, processing, and evaluation of data in Optical Imaging and Metrology (digital wavefront engineering, computational imaging, model-based reconstruction, compressed sensing, inverse problems solution) - Application-driven technologies in Optical Imaging and Metrology (high-resolution, adaptive, active, robust, reliable, flexible, in-line, real-time) - High-dynamic range solutions in Optical Imaging and Metrology (from macro to nano) - Hybrid technologies in Optical Imaging and Metrology (hybrid optics, sensor and data fusion, model-based solutions, multimodality) - New optical sensors, imaging and measurement systems (integrated, miniaturized, in-line, real-time, traceable, remote) Special emphasis is put on new strategies, taking into account the active combination of physical modeling, computer aided simulation and experimental data acquisition. In particular attention is directed towards new approaches for the extension of existing resolution limits that open the gates to wide-scale metrology, ranging from macro to nano, by considering dynamic changes and using advanced optical imaging and sensor systems.